What to expect from the 3rd Edition of the European 3D TSV Summit

Interview with SEMI Europe’s Yann Guillou gives attendees a preview of the event

This year’s European 3D TSV Summit is fast approaching. Many actors from the 3D TSV supply chain will convene to Grenoble (France) on Jan 19-21, 2015. This year’s theme is “Enabling Smarter Systems”.

In a recent interview published by 3DIncites, Yann Guillou, the event’s architect, revealed the inspiration behind this year’s theme. “Each year, we try to have our conference theme reflect the current state of 3D technology as expressed by industry leaders,” he explained. “When we look at the most recent evolution of 3D TSV technology, we see that TSVs have become an indispensable part of the smarter systems development, so the theme ‘Enabling Smarter Systems’ seemed to stem quite naturally from this.”

The Summit will boast three keynote speakers who are experts in the field of 3D TSV.  In the interview, Guillou shares his excitement about the keynote choices, who all hail from companies particularly active in the 3D TSV sector. Of keynote speaker Timo Henttonen, Senior manager of packing at Microsoft, Guillou said: “For years, [he] has been a key person at Nokia in the packaging group driving new technology developments and implementing them in large volumes. Now, with Nokia’s mobile phone unit having been absorbed into Microsoft, what Timo will share with attendees should be a highlight of the Summit.” Also participating as keynote speakers will be Bryan Black, Senior Fellow at AMD and Bill Chen, Fellow and Senior Technical Advisor at ASE Group.Of the latter, Guillou says, “Bill rarely delivers talks in Europe, and I’m sure he will have key messages to pass on to attendees in his explanation of how ASE sees TSV contributing to their upcoming business activities.”

Along with keynote speakers, the conference will offer a host of invited speakers to discuss various topics that relate to 3D TSV. According to Yann Guillou, multiple criteria such as internationality and diversity of functions in the supply chain determine which speakers will be invited to present at the European 3D TSV Summit. To continue offering a program that deals with the most pressing challenges being faced by manufacturers, SEMI will include new subjects that have not been treated in previous editions of the Summit.

“For instance,” Mr. Guillou explains, “we wanted to have some presentations on ‘Interposers’, from a product and business perspective as well as from a technology perspective. In this regard, on the interposer technology side, we will take a closer look at the glass approach that is important not to neglect.”

For the first time ever, the Summit will also highlight 3D TSV technology in photonics hosting IBM and HP to present on the subject.

Since its debut, the organizers of the European 3D TSV Summit have insisted on the importance of presenting 3D TSV not only from a technology angle, but also from a business angle. “SEMI is a trade association,” states Guillou, “and one of our main goals is to inform and support our members in detecting business opportunities.” This year, SEMI will take this one step further, offering an entire Market Briefing dedicated to the outlook for the 2.5D and 3D markets, and hosting market analysts from Yole Développement, ATREG, TechSearch International and AlixPartners.

When asked what is unique about the event, Yann Guillou answers, “We are proposing a full ‘experience’ for attendees… The event is a unique combination of keynote and invited talks, industry-relevant panel discussion and a quite specialized exhibition that receives high foot traffic.” With over 330 attendees at each of the past two editions of the European 3D TSV Summit, it appears that the 3D TSV community has embraced the concept.

For more information about the European 3D TSV Summit, you can visit the website: www.semi.org/European3DTSVSummit


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *


KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...
Leak check semiconductor process chambers quickly and reliably
02/08/2018INFICON,a manufacturer of leak test equipment, introduced the UL3000 Fab leak detector for semiconductor manufacturing maintenance teams t...