IEEE International Electron Devices Meeting announces 2015 Call for Papers

The 61st annual IEEE International Electron Devices Meeting (IEDM) has issued a Call for Papers seeking the world’s best original work in all areas of microelectronics research and development. The paper submission deadline is Monday, June 22, 2015 at 23:59 p.m. Pacific Time.

Overall, the 2015 IEDM is seeking increased participation in the areas of ‘Beyond CMOS’ devices, flexible devices, neuromorphic computing, power devices, sensors for the Internet of Things (IoT) and variation/reliability.

In addition, Special Focus Sessions will be held on the following topics: neural-inspired architectures; 2D materials and applications; flexible electronics and applications; power devices and reliability on non-native substrates; and silicon-based nanodevices for detection of biomolecules.

The 2015 IEDM will take place at the Washington, DC Hilton Hotel from December 7-9, 2015, preceded by a collection of 90-minute afternoon Tutorial sessions on Saturday, Dec. 5, and a full day of Short Courses on Sunday, Dec. 6. On Wednesday the conference will continue the successful Entrepreneurs Luncheon sponsored by IEDM and EDS Women in Engineering.

At IEDM each year, the world’s best scientists and engineers in the field of microelectronics from industry, academia and government gather to participate in a technical program of more than 220 presentations, along with a special Luncheon Presentation on Tuesday, Dec. 8 and a variety of panels, special sessions, Short Courses, IEEE/EDS award presentations and other events spotlighting more leading work in more areas of the field than any other conference.

Papers in the following areas are encouraged:
– Circuit and Device Interaction
– Characterization, Reliability and Yield
– Display and Imaging Systems
– Memory Technology
– Modeling and Simulation
– Nano Device Technology
– Power and Compound Semiconductor Devices
– Process and Manufacturing Technology
– Sensors, MEMS and BioMEMS

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

One thought on “IEEE International Electron Devices Meeting announces 2015 Call for Papers

Leave a Reply

Your email address will not be published. Required fields are marked *

NEW PRODUCTS

Introducing Semiconductor Digest
04/30/2019Semiconductor Digest is a new magazine dedicated to the worldwide semiconductor industry...
KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...