DCG Systems, Inc. announced today that it has acquired the assets of MultiProbe, Inc., a provider of atomic force-based nanoprobing solutions for the semiconductor industry. MultiProbe was founded in 2001 to address the growing needs of failure analysis (FA) engineers and to help the industry find solutions for device technology development. DCG’s MultiProbe operations will remain in Santa Barbara, California.
“The AFP-based nanoprobers offered by MultiProbe complement DCG Systems’ SEM-based nanoprobing product portfolio,” said Dr. Israel Niv, Chief Executive Officer of DCG Systems, Inc. “Being able to call upon the strengths of two distinct technologies will help the combined companies better address the breadth of yield-limiting electrical fault issues that our diverse customer base is facing now and in the future.”
MultiProbe’s flagship product, the Hyperion, uses atomic force probe (AFP) technology to provide characterization and localization of electrical faults in transistors. The MultiProbe systems can also be operated in a mode called PicoCurrent imaging, which simultaneously displays variations in topography and conductivity, allowing engineers to quickly identify anomalous features that can be further investigated by transistor probing.
DCG’s flagship nanoprobing system, the nProber II, is built upon a scanning electron microscope (SEM) platform. Like the Hyperion, the nProber II system delivers electrical fault localization and characterization of transistors. The nProber II can also be operated in electron-beam current (EBC) mode to localize surface and sub-surface shorts, opens and resistive faults within interconnect structures.
“I am pleased to hand over the reins of MultiProbe to DCG Systems at a time when nanoprobing is becoming increasingly critical to yield engineering,” said Andy Erickson, founder and Chief Executive Officer of MultiProbe. “In addition, our customers will benefit from the strength of the combined worldwide applications and service team.”
Both the Hyperion and nProber II nanoprobing systems have been installed at multiple customer sites worldwide, where they are being used to accelerate development and yield of devices down to the 10nm node.
Headquartered in Fremont, California, DCG Systems, Inc. is a supplier of electrical fault characterization, localization and editing equipment, serving process development, yield ramp and failure analysis applications for a wide range of semiconductor and electronics manufacturers. DCG Systems has field offices in the United States, Japan, Taiwan, Korea, Malaysia, Singapore, Israel and Germany.