Laser diode researchers order Oxford Instruments ion beam depo tool

August 23, 2012 — Optoelectronics researchers at the Ferdinand-Braun-Institut (FBH) ordered an Optofab3000 for Laser Bar Facet Coating from Oxford Instruments Plasma Technology. The advanced ion beam deposition (IBD) tool will deposit high-quality optical thin films for high-power and high-brightness laser diodes (LDs) at 0.63-1.12µm wavelengths, based on III-V semiconductor layer structures.

Photo 1. An Optofab3000 ion beam tool.

The tool offered both high-quality deposition and an advanced in-situ optical monitor, said Dr. Götz Erbert, head of the Optoelectronics Department at FBH. The tool can also achieve R&D tasks as well as pilot production, which the institute performs in some cases.

Photo 2. Inside an Optofab3000.

The Optofab3000 ion beam tool is scheduled to be delivered by the end of 2012.

Learn more at http://www.oxford-instruments.com/Pages/home.aspx.

Visit the LED Manufacturing Channel on Solid State Technology and subscribe to the LED Manufacturing News monthly e-newsletter!

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <strike> <strong>

NEW PRODUCTS

SEMI-GAS broadens gas mixing capabilities for highly corrosive gases
08/28/2014SEMI-GAS Systems, a provider of ultra-high purity gas delivery equipment, recently broadened the capabilities of its custom Xturion ...
Entegris announces GateKeeper GPS platform
07/15/2014Entegris, Inc., announced last week the launch of GateKeeper GPS, its next-generation of automated regeneration gas purification system (GPS) technology....
Bruker introduces Inspire nanoscale chemical mapping system
07/15/2014Bruker today announced the release of Inspire, the first integrated scanning probe microscopy (SPM) infrared system for 10-nanometer spatial...