Thursday, Nov 21, 2013 at 2 p.m. ET
Register here: https://event.webcasts.com/starthere.jsp?ei=1025476
Continued scaling and more complex device structures, including FinFETs and 3D stacking, are creating new challenges in metrology and inspection. Smaller defects must be detected and analyzed on an increasingly diverse set of materials. Chip makers are looking for better wafer edge inspection techniques, higher resolution metrology tools, 450mm-capability and new compositional analysis solutions. Experts will describe new approaches for next generation metrology and inspection, including measurements of CDs, stress, film thickness and non-visual defects.
Speakers:
Mike Lercel, Senior Director for Nanodefectivity and Metrology at SEMTECH
Alain Diebold, Executive Director at the Center for Nanoscale Metrology SUNY College of Nanoscale Science and Engineering
Moderated by Pete Singer, Editorial Director
Mark your calendars!
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When and where can I sign up to listen to these presentations?
Hi Franz,
The registration page for this webcast will go live shortly and I will send you the link.
Thanks!
Sabrina
Hi,
The registration page for the Next Generation Metrology and Inspection webcast is now live.
You may register here: https://event.webcasts.com/starthere.jsp?ei=1025476
Thank you,
Sabrina
Sabrina Straub
Sales Manager
The ConFab, Solid State Technology webcasts, Multicore Developers Conference
603.770.6569
Hi,
The registration page for the Next Generation Metrology and Inspection webcast is now live.
You may register here: https://event.webcasts.com/starthere.jsp?ei=1025476
Thank you,
Sabrina
Sabrina Straub
Sales Manager
The ConFab, Solid State Technology webcasts, Multicore Developers Conference
603.770.6569
please send me the link of registration. thx
Hi,
The registration page for the Next Generation Metrology and Inspection webcast is now live.
You may register here: https://event.webcasts.com/starthere.jsp?ei=1025476
Thank you,
Sabrina
Sabrina Straub
Sales Manager
The ConFab, Solid State Technology webcasts, Multicore Developers Conference
603.770.6569
Please sen me registration link link
Thanks
Hi,
The registration page for the Next Generation Metrology and Inspection webcast is now live.
You may register here: https://event.webcasts.com/starthere.jsp?ei=1025476
Thank you,
Sabrina
Sabrina Straub
Sales Manager
The ConFab, Solid State Technology webcasts, Multicore Developers Conference
603.770.6569
.. please send me the reg. link. thx
Hi,
The registration page for the Next Generation Metrology and Inspection webcast is now live.
You may register here: https://event.webcasts.com/starthere.jsp?ei=1025476
Thank you,
Sabrina
Sabrina Straub
Sales Manager
The ConFab, Solid State Technology webcasts, Multicore Developers Conference
603.770.6569
Hello, I would like to register, but there is no link to do it.
Can you please send me the link??
Thx.
Hi,
The registration page for the Next Generation Metrology and Inspection webcast is now live.
You may register here: https://event.webcasts.com/starthere.jsp?ei=1025476
Thank you,
Sabrina
Sabrina Straub
Sales Manager
The ConFab, Solid State Technology webcasts, Multicore Developers Conference
603.770.6569