New AFM with high definition electrical measurement capabilities

Nanoscience Instruments is pleased to offer the new Nano-Observer atomic force microscope (AFM). The Nano-Observer, designed by Concept Scientific Instruments, is ideal for current and future AFM research applications. Advanced and unique electrical measurements highlight the AFM’s key strengths. High Definition single-pass Kelvin Probe Force Microscopy (KFM) provides high resolution surface potential mapping. Electrical measurements, like Conductive AFM, can be performed with the ResiScope covering 10 orders of magnitude.

“The Nano Observer applies new technologies for atomic force microscopy. In combination with the ResiScope, the Nano-Observer takes AFM well beyond imaging,” explains Sebastian Kossek, co-founder of Nanoscience Instruments. “This technology allows for quantitative electrical characterization of a wide range of materials including semiconductors, conductive polymers or thin films.”

The Nano-Observer delivers new technology well-suited to solve challenges in advanced materials research and development. Research in materials science, thin films, semiconductors, data storage and nanomaterials will all benefit from using a Nano-Observer AFM. The user interface is intuitive yet flexible and can be customized for a range of applications.

“We are very pleased to announce the new Nano-Observer AFM. The instrument greatly adds to our capabilities at Nanoscience Instruments,” says Mark Flowers, co-founder of Nanoscience Instruments, “These innovative techniques allow us to provide a more comprehensive solution to our customers developing new, advanced engineered materials.”

The ResiScope, an award-winning innovative module, can be combined with the Nano-Observer to measure resistance over 10 orders of magnitude using atomic force microscopy. Resistance measurements can be coupled with magnetic force microscopy, electric force microscopy or single-pass Kelvin probe force microscopy imaging modes to acquire multiple properties in the same scan area.

nano observer AFM

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