METROLOGY
MAGAZINE
Volume 56, Issue 5
SEMICONDUCTORS BLOG
Economy Threatens Semi Growth, not Technology – so Say Fab Engineers at ASMC
Thu Jun 06 15:07:00 CDT 2013
METROLOGY ARTICLES
New methods to reduce time and cost of R&D;
07/09/2013
SEMICON West 2013 included a robust set of technical and marketing presentations on the general theme of developing new semiconductor devices in th...
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Toshiba to expand semiconductor fabrication facility
07/03/2013
Fab 5 second phase construction will start at the end of August this year and be completed in summer next year. Decisions on equipment investment a...
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Effects of measured spectral range on accuracy and repeatability of OCD analysis
07/01/2013
A broadband polarized reflectometry measurement, utilizing RCWA analysis, can be used to obtain detailed trench profile results. FRANZ HEIDER, Infi...
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Trends in Technology from The ConFab: 450mm transition update
06/26/2013
Many questions still surround the elusive 450mm transition, but progress, while slow, remains steady at the Global 450mm Consortium, as General Man...
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New abatement solutions help achieve GHG targets
06/26/2013
The news today is filled with stories about greenhouse gas (GHG) emissions and global warming, but these are not new discussion topics for the semi...
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HEADLINES
Nikon to Supply 450 mm Immersion Scanner and Patterning Services for Global 450 mm Consortium
Nikon Corp. announced a newly established partnership agreement with the Research Foundation for the State University of New York (SUNY).According ...
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-Air Products to Highlight Advanced Materials and Delivery Systems at SEMICON West
ENP Newswire - 11 July 2013Release date- 10072013 - Air Products (NYSE:APD) will highlight its advanced materials and delivery systems at SEMICON W...
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MICRON TECHNOLOGY REPORTS MULTIPLE TRANSACTIONS BY VP FINANCE FOSTER (Idaho)
WASHINGTON, July 11 -- Micron Technology Inc. (MU), Boise, Idaho, has filed a Form 4 with the Securities and Exchange Commission noting the change ...
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-Fairchild Semiconductor Begins Production at Eight-Inch Wafer Fabrication Line in Korea
ENP Newswire - 10 July 2013Release date- 09072013 - SAN JOSE, Calif. - Fairchild Semiconductor (NYSE: FCS), a leading global supplier of high perfo...
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Microscopy Devices Market is Expected to Reach USD 6.2 Billion Globally in 2018: Transparency Market Research
According to a new market report published by Transparency Market Research (http://www.transparencymarketresearch.com) "Microscopy Devices Mar...
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Lattice Semiconductor introduces Lattice Automotive devices
The six new devices leverage Lattice's expertise in low power, small size, and cost optimized FPGAs to deliver programmable technology that can be ...
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Cadence Solutions Enable Successful Tape Out of 20-Nanometer SoC Test Chip by Global Unichip Corporation
SAN JOSE, CA--(Marketwired - July 9, 2013) - Cadence Design Systems (NASDAQ: CDNS), a leader in global electronic design innovation, today announc...
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SEMICONDUCTORS FINANCIALS
TECHNOLOGY PAPERS
Rapid Defect Indentification with Layout-Aware Diagnosis
Scan logic diagnosis is a powerful tool to help failure analysis engineers determine the root cause of a failing die. Yield engineers, on the other hand, are...
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Flip Chip Devices get Flat and Happy
Thin is definitely in, but what our modern flip chip devices really want is to be flat and happy! As flip chip die have become increasingly thinner in recent...
Sponsored by
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Automated Test Creation for Mixed Signal IP using IJTAG
The creation of test patterns for mixed signal IP has been, to a large extent, a manual effort. To improve the process used to test, access, and control embe...
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WEBCASTS
On Demand Webcasts |
Surface Cleaning and Preparation
This introduction requires the development of new critical and selective cleans tackling galvanic corrosion, pattern collapse both in FEOL and BEOL...
Sponsored by
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450mm Status Report
Hear from the G450C General Manager, Paul Farrar Jr., on the current status of activities, key milestones and schedules, and imec’s senior business...
Sponsored by
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Innovation in Semiconductor Manufacturing Instrumentation
As the semiconductor industry moves toward smaller geometries, manufacturing processes are becoming more complex. In particular, they’re more deman...
Sponsored by
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