BiTS: The ever-shrinking package underscores emerging challenges and solutions

By Ira Feldman, general chair, BiTS 

What’s the single area that is being most disrupted by emergent technologies like the Internet of Things (or the Internet of Vehicles) and Silicon Photonics? We think it’s packaging. The cost and size constraints of these pervasive devices is driving ever more “shrink” – and innovation in the area of packaging – in order to deliver their benefits to every aspect of our daily lives. From fancy pedometers that are auditing our every step to all the data centers that are required to host the big data that is being created … ICs are at the core of the transformation and the test and packaging of these devices is incrementally more challenging.

“Silicon Photonics manufacturing has evolved to the point where it is now possible to manufacture a silicon photonics die using a standard CMOS manufacturing line. But, one challenge remained unsolved: how to test these applications at wafer level in a volume production environment,” said Jose Moreira, senior staff engineer at Advantest. “Working in conjunction with Tokyo Electron Labs and STMicroelectronics, a test cell implementation for testing mixed digital and silicon photonics ICs has been devised. In our Burn-In and Test Strategies (BiTS) Workshop presentation, we will review a solution for a high volume test cell for an OSAT environment.”

bits 2 bits

Now in its 17th year, BiTS offers a full technical program that spans four days including sessions on MEMS test, WLCSP test, Test Cell Integration, simulation & modeling, materials, and more. This year’s Tutorial is a practicum on the theory and statistics that underlie Adaptive Test to include test time reduction and outlier detection. The BiTS EXPO showcases the latest in test cell hardware, services, and consumables including sockets, load boards, contactors, materials, and more. BiTS has plenty of time for networking, great food, and warm weather! Attend the Burn-In and Test Strategies (BiTS) Workshop (March 6-9) in Mesa, Arizona. SEMI has arranged a special discount of $50 off registration when using the code of 50SEM.


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <s> <strike> <strong>



Low-outgassing Faraday Isolators to improve lifetime and reliability of optical systems
02/18/2016Qioptiq, an Excelitas Technologies company introduces the LINOS Low-outgassing Faraday Isolators, the first of th...
Versatile high throughput SEM from JEOL
11/04/2015JEOL's new JSM-IT100 is the latest addition to its InTouchScope Series of Scanning Electron Microscopes....
Entegris expands CMP filtration technology solutions and research, analytical and manufacturing capabilities
09/04/2015The Entegris filter platform using NMB media now includes the Planargard bulk, Solaris point...