EDITORS' PICKS
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10/17/2013How bad were conditions in the notebook PC market during the second quarter?...
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10/09/2013Semiconductor capital spending has increased significantly among pure-play foundries as more IDMs shift to a fabless/fab-lite business model and as...
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10/18/2013Total shipments of analog devices forecast to jump 14% in 2013....
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10/09/2013Silicon Labs, a developer of high-performance, analog-intensive, mixed-signal ICs, today introduced the industry’s most energy-friendly 3...
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MAGAZINE![]() BLOGS |
NEWS ANALYSIS & FEATURES![]() 10/18/2013 Wireless video, network interfaces, multi-format decoders, LED backlighting boost average semiconductor content per TV. ![]() 10/17/2013 ParkerVision, Inc., a developer and marketer of semiconductor technology solutions for wireless applications, today announced that a jury in the U.S. District Court for the Middle District of Florida found Qualcomm Incorporated guilty of direct and indirect infringement of ParkerVision patents. ![]() 10/17/2013 MEMS Technology Showcase will give MEMS Executive Congress US attendees an intimate look at some of the most unique and inspiring MEMS-enabled applications in the business. After a competitive application process, MEMS Industry Group (MIG) has selected five finalists that show how MEMS enhances the consumer experience, highlighting the “MEMS inside the machine.” ![]() 10/17/2013 Nov 7 at 3 PM ET. Continued scaling and more complex device structures, including FinFETs and 3D stacking, are creating new challenges in metrology and inspection. Smaller defects must be detected and analyzed on an increasingly diverse set of materials. Chip makers are looking for better wafer edge inspection techniques, higher resolution metrology tools, 450mm-capability and new compositional analysis solutions. Experts will describe new approaches for next generation metrology and inspection, including measurements of CDs, stress, film thickness and non-visual defects. ![]() 10/17/2013 Applied Materials introduced three new tools for the display market aimed at metal oxide thin film transistors. ![]() 10/17/2013 When facilities management and water treatment company MSS Group was called in to clean up the process water in a globally renowned manufacturer of semiconductor wafers, the company was presented with an untreated water system suffering from significant corrosion. ![]() 10/16/2013 Applied Materials, Inc. today announced new technology systems for manufacturing large size and ultra-high definition (UHD) LCD and OLED displays that meet the demand for greater screen performance, clarity, color and brightness. ![]() 10/16/2013 Nanoelectronics research center imec and Excico have successfully demonstrated the application of laser thermal anneal (LTA) to boost the current in vertical polysilicon channel devices for 3D memory. ![]() 10/16/2013 Largely driven by demand from upscale Samsung smartphones, particularly the Galaxy S4, global shipments of high-end active-matrix organic light-emitting diode (AMOLED) display panels posted impressive sequential growth of 16 percent in the second quarter. ![]() 10/16/2013 For several technology nodes now, designers have been required to run lithography-friendly design (LFD) checks prior to tape out and acceptance by the foundry. Due to resolution enhancement technology (RET) limitations at advanced nodes, we are seeing significantly more manufacturing issues, even in DRC-clean designs. ![]() 10/15/2013 Intersil Corporation, a provider of innovative power management and precision analog solutions, today announced the appointment of Roger Wendelken as senior vice president of worldwide sales effective immediately. ![]() 10/15/2013 Small form factor, high speed and performance, and high bandwidth capability with low battery consumption are desired traits for many packaging solutions for integrated circuits (ICs). ![]() 10/15/2013 At IEDM, IBM researchers will report on a CMOS-compatible 200 mm wafer-scale sub-20nm nanochannel fabrication method that enables stretching, translocation and real-time fluorescence microscopy imaging of single DNA molecules. ![]() 10/08/2013 Initiated by Apple’s launch of the iPhone, the subsequent explosive growth of the smartphone market has provided the MEMS industry with one of its biggest opportunities to supply high-volume demand. But if motion sensing in our portable electronics – enabled by accelerometer and gyroscope MEMS applications for example – is the tip of the iceberg for MEMS technology how can the semiconductor industry ensure that high volume markets like consumer electronics benefit from all that MEMS potentially has to offer. ![]() |
VIDEOS |
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RECOMMENDED TECHNOLOGY PAPERS![]() This paper explains the basic history, processes, and applications of the ultimate conformal coating, parylene. Parylene has historically been used to protect printed circuit boards, LEDS, and medical devices from rugged environments and the human body, but now the pin-hole free coating is being used increasingly by the leaders in the MEMS market. With no known chemical that can harm the film, it is a perfect application for fuel tanks, water meters, or any product that must function in a hazardous environment.October 04, 2013 ![]() Designed to encapsulate today’s high-performing semiconductor components, transfer mold compounds deliver critical device protection and performance stability. Indeed, they are essential materials and require expertise to formulate and manufacture, particularly when it comes to the performance needed for modern IC’s and power discretes that run at higher voltages in power management applications..September 17, 2013 ![]() Microelectromechanical systems -- commonly known as MEMS -- applications are on the rise. In fact, the MEMS market is currently outpacing overall IC market growth at a rate that is twice as fast and is expected to be a $20B US market as early as 2017. Why the uptick in MEMS use? The consumer (primarily handheld) and automotive markets hold the answer for now, but other market sectors such as me... July 19, 2013 ![]() |
WEBCASTS![]() Nov 7 at 3 PM ET. Continued scaling and more complex device structures, including FinFETs and 3D stacking, are creating new challenges in metrology and inspection. Smaller defects must be detected and analyzed on an increasingly diverse set of materials. Chip makers are looking for better wafer edge inspection techniques, higher resolution metrology tools, 450mm-capability and new compositional analysis solutions. Experts will describe new approaches for next generation metrology and inspection, including measurements of CDs, stress, film thickness and non-visual defects. ![]() Packaging technology is driven by a combination of cost, performance, form factor and reliability. This webcast will examine new advances in conventional back-end packaging, including wafer bumping and copper wire bonding, as well as the role of new 2.5D and 3D integration. Presenters will focus on isssues related to cost, performance (speed, power and noise immunity), form factor (thickness, weight, PCB area consumption), and testability, as well as the tradeoff of technical maturity versus risk in high-volume manufacturing.
Sponsored By:
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This introduction requires the development of new critical and selective cleans tackling galvanic corrosion, pattern collapse both in FEOL and BEOL process steps. An additional challenge is that the reduction in device size and an increase in device topography makes the removal of small particles even more challenging.
Sponsored By:
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EVENTS![]() Tel Aviv, Israel Israel http://www.comcas.org/ October 21, 2013 - October 23, 2013 ![]() Montreal, Quebec, Canada http://www.matscitech.org/about/future-meetings/ October 27, 2013 - October 31, 2013 ![]() Arlington, Virginia United States http://www.ieeesisc.org/ December 04, 2013 - December 07, 2013 ![]() Washington D.C. United States http://www.ieee.org/ December 06, 2013 - December 13, 2013 |
FINANCIALS |
NEW COMMENTSNext Generation Metrology and Inspection Parylene 101: Learn about the best protection for MEMS Pure-play foundries spending big on capital equipment |
NEW PRODUCTS![]() ![]()
10/15/2013Jordan Valley Semiconductors Ltd. received another order for its recently introduced JVX7300LMI scanning X-ray in-line metrology tool for patterned and blanket ...
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10/07/2013Brooks Instrument, a provider of advanced flow, pressure, vacuum and level solutions, has expanded its GF 40/80 Series portfolio of thermal mass flow controllers (MFC...
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10/07/2013The dry pumps A 100 L with their compact dimensions were specially developed for flexible integration in semiconductor production facilities....
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