EDITORS' PICKS


Booming market for touch-screen notebook PC displays hits speed bump in second quarter
10/17/2013How bad were conditions in the notebook PC market during the second quarter?...
Pure-play foundries spending big on capital equipment
10/09/2013Semiconductor capital spending has increased significantly among pure-play foundries as more IDMs shift to a fabless/fab-lite business model and as...
 
Power management, industrial analog units post strong gains
10/18/2013Total shipments of analog devices forecast to jump 14% in 2013....
Silicon Labs launches the world’s most energy-friendly MCUs
10/09/2013Silicon Labs, a developer of high-performance, analog-intensive, mixed-signal ICs, today introduced the industry’s most energy-friendly 3...

MAGAZINE




BLOGS


NEWS ANALYSIS & FEATURES


TV semiconductor market growing despite decline in TV shipments

10/18/2013  Wireless video, network interfaces, multi-format decoders, LED backlighting boost average semiconductor content per TV.

Jury finds Qualcomm guilty of patent infringement

10/17/2013  ParkerVision, Inc., a developer and marketer of semiconductor technology solutions for wireless applications, today announced that a jury in the U.S. District Court for the Middle District of Florida found Qualcomm Incorporated guilty of direct and indirect infringement of ParkerVision patents.

MEMS Technology Showcase finalists highlight “MEMS Inside the Machine”

10/17/2013  MEMS Technology Showcase will give MEMS Executive Congress US attendees an intimate look at some of the most unique and inspiring MEMS-enabled applications in the business. After a competitive application process, MEMS Industry Group (MIG) has selected five finalists that show how MEMS enhances the consumer experience, highlighting the “MEMS inside the machine.”

Next Generation Metrology and Inspection

10/17/2013  Nov 7 at 3 PM ET. Continued scaling and more complex device structures, including FinFETs and 3D stacking, are creating new challenges in metrology and inspection. Smaller defects must be detected and analyzed on an increasingly diverse set of materials. Chip makers are looking for better wafer edge inspection techniques, higher resolution metrology tools, 450mm-capability and new compositional analysis solutions. Experts will describe new approaches for next generation metrology and inspection, including measurements of CDs, stress, film thickness and non-visual defects.

Applied Materials rolls out new CVD and PVD systems for IGZO-based displays

10/17/2013  Applied Materials introduced three new tools for the display market aimed at metal oxide thin film transistors.

Argument for not cleaning up process water is wafer thin

10/17/2013  When facilities management and water treatment company MSS Group was called in to clean up the process water in a globally renowned manufacturer of semiconductor wafers, the company was presented with an untreated water system suffering from significant corrosion.

Applied Materials launches new metal oxide display tech

10/16/2013  Applied Materials, Inc. today announced new technology systems for manufacturing large size and ultra-high definition (UHD) LCD and OLED displays that meet the demand for greater screen performance, clarity, color and brightness.

Laser thermal anneal to boost performance of 3D memory devices

10/16/2013  Nanoelectronics research center imec and Excico have successfully demonstrated the application of laser thermal anneal (LTA) to boost the current in vertical polysilicon channel devices for 3D memory.

AMOLED panel shipments surge in Q2

10/16/2013  Largely driven by demand from upscale Samsung smartphones, particularly the Galaxy S4, global shipments of high-end active-matrix organic light-emitting diode (AMOLED) display panels posted impressive sequential growth of 16 percent in the second quarter.

Model-based hints: GPS for LFD success

10/16/2013  For several technology nodes now, designers have been required to run lithography-friendly design (LFD) checks prior to tape out and acceptance by the foundry. Due to resolution enhancement technology (RET) limitations at advanced nodes, we are seeing significantly more manufacturing issues, even in DRC-clean designs.

Intersil appoints Roger Wendelken as senior VP of worldwide sales

10/15/2013  Intersil Corporation, a provider of innovative power management and precision analog solutions, today announced the appointment of Roger Wendelken as senior vice president of worldwide sales effective immediately.

Rising demand for array IC packaging

10/15/2013  Small form factor, high speed and performance, and high bandwidth capability with low battery consumption are desired traits for many packaging solutions for integrated circuits (ICs).

IBM develops sub-20nm nanofluidic channels for lab-on-chip

10/15/2013  At IEDM, IBM researchers will report on a CMOS-compatible 200 mm wafer-scale sub-20nm nanochannel fabrication method that enables stretching, translocation and real-time fluorescence microscopy imaging of single DNA molecules.

Marrying diversification, innovation with high-volume manufacturing – the MEMS puzzle

10/08/2013  Initiated by Apple’s launch of the iPhone, the subsequent explosive growth of the smartphone market has provided the MEMS industry with one of its biggest opportunities to supply high-volume demand. But if motion sensing in our portable electronics – enabled by accelerometer and gyroscope MEMS applications for example – is the tip of the iceberg for MEMS technology how can the semiconductor industry ensure that high volume markets like consumer electronics benefit from all that MEMS potentially has to offer.

MORE ANALYSIS & FEATURES

VIDEOS

RECOMMENDED TECHNOLOGY PAPERS

Parylene 101: Learn about the best protection for MEMS

This paper explains the basic history, processes, and applications of the ultimate conformal coating, parylene. Parylene has historically been used to protect printed circuit boards, LEDS, and medical devices from rugged environments and the human body, but now the pin-hole free coating is being used increasingly by the leaders in the MEMS market. With no known chemical that can harm the film, it is a perfect application for fuel tanks, water meters, or any product that must function in a hazardous environment.October 04, 2013
Sponsored by Diamond-MT

Mold Compound Advances Require World-Class Capability

Designed to encapsulate today’s high-performing semiconductor components, transfer mold compounds deliver critical device protection and performance stability. Indeed, they are essential materials and require expertise to formulate and manufacture, particularly when it comes to the performance needed for modern IC’s and power discretes that run at higher voltages in power management applications..September 17, 2013
Sponsored by Henkel Corporation

MEMS Need Comprehensive, Market-Ready Solutions

Microelectromechanical systems -- commonly known as MEMS -- applications are on the rise. In fact, the MEMS market is currently outpacing overall IC market growth at a rate that is twice as fast and is expected to be a $20B US market as early as 2017. Why the uptick in MEMS use? The consumer (primarily handheld) and automotive markets hold the answer for now, but other market sectors such as me... July 19, 2013
Sponsored by Henkel Corporation

More Technology Papers

WEBCASTS

Next Generation Metrology and Inspection

Nov 7 at 3 PM ET. Continued scaling and more complex device structures, including FinFETs and 3D stacking, are creating new challenges in metrology and inspection. Smaller defects must be detected and analyzed on an increasingly diverse set of materials. Chip makers are looking for better wafer edge inspection techniques, higher resolution metrology tools, 450mm-capability and new compositional analysis solutions. Experts will describe new approaches for next generation metrology and inspection, including measurements of CDs, stress, film thickness and non-visual defects.

Advanced Packaging

Packaging technology is driven by a combination of cost, performance, form factor and reliability. This webcast will examine new advances in conventional back-end packaging, including wafer bumping and copper wire bonding, as well as the role of new 2.5D and 3D integration. Presenters will focus on isssues related to cost, performance (speed, power and noise immunity), form factor (thickness, weight, PCB area consumption), and testability, as well as the tradeoff of technical maturity versus risk in high-volume manufacturing.

Sponsored By:
Surface Cleaning and Preparation

This introduction requires the development of new critical and selective cleans tackling galvanic corrosion, pattern collapse both in FEOL and BEOL process steps.  An additional challenge is that the reduction in device size and an increase in device topography makes the removal of small particles even more challenging.

Sponsored By:
More Webcasts

EVENTS

2013 IEEE 44th Semiconductor Interface Specialists Conference (SISC)
Arlington, Virginia United States
http://www.ieeesisc.org/
December 04, 2013 - December 07, 2013
2013 IEEE International Electron Devices Meeting (IEDM)
Washington D.C. United States
http://www.ieee.org/
December 06, 2013 - December 13, 2013

FINANCIALS

NEW COMMENTS


Next Generation Metrology and Inspection
Parylene 101: Learn about the best protection for MEMS
Pure-play foundries spending big on capital equipment

NEW PRODUCTS

Jordan Valley lands order for FEOL tool
10/15/2013Jordan Valley Semiconductors Ltd. received another order for its recently introduced JVX7300LMI scanning X-ray in-line metrology tool for patterned and blanket ...
Brooks Instrument unveils new MFCs
10/07/2013Brooks Instrument, a provider of advanced flow, pressure, vacuum and level solutions, has expanded its GF 40/80 Series portfolio of thermal mass flow controllers (MFC...
Pfeiffer Vacuum introduces energy-saving dry pumps
10/07/2013The dry pumps A 100 L with their compact dimensions were specially developed for flexible integration in semiconductor production facilities....